Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Production Line Test System
1740
The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operator judgment, and online statistics for all tests.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 62.1Ω
40-298-111
The 40-298-111 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High-Performance Autoranging DC Power Module, 60V, 20A, 300W
N6754A
This module is used in both the small, multiple output 1U high N6700 Low-Profile Modular Power System (for ATE systems) and the multiple output N6705 DC Power Analyzer (for bench testing). GPIB, LAN, USB, and LXI compliance are standard. Select from more than 20 different DC power modules, ranging in capability from basic to high precision, and in power from 20 - 300 W.
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3 Phase Voltage Extension To Turns Ratio Meter Rack
T-REX R
The Raytech three phase voltage system option T-Rex R is an optional system accessory for 3- Phase transformer ratio meter test sets designed by Raytech (i.e. TR-MARK III R). T-Rex R was designed to give Engineers and Test Technicians the ability to test the phase relationships and actual voltage ratios of transformer windings while applying three phase voltage.
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Test Benches
Atec has made test equipment throughout all of its 65-year history. Test benches for aerospace and energy uses represent a significant segment of our experience. Atec has produced test benches involving hydraulics, mechanicals, electromechanicals, electronics, pneumatics, motors, and digital automation. Atec test benches have performed for challenging measurements, factory production, problem analysis and component overhaul scenarios. Today, complex test benches have capable data acquisition, co...show more -
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Field Strength Analyzer
SRM-3006
Selective measurement of high frequency electromagnetic fields. Complete, easy to use test system, consisting of a base unit and measuring antennas, for non-directional detection of fields and their sources in the frequency range from 9 kHz to 6 GHz and from 24.25 GHz up to 29.50 GHz with 5G FR2 Antenna.
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Test & Measurement Matrix Switches
Quintech Electronics and Communications Inc.
Quintech Electronics & Communications, Inc. have provided keystone NEXUS brand Test & Measurement matrix switches to tier one wireless testing laboratories around the world. These RF matrix switching systems allow for wireless test lab automation providing repeatable, recordable and remotely controlled testing. Our global customer base includes network service providers, network equipment, chipset, and device and UE manufacturers. This automation is critical for the complex, ever changing wireless environment referred to as 4G, 5G Wi-Fi, LTE, LTE-U, IoT, commonly referenced with regard to convergence and the networked society.
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Fuel Flow Measurement Systems
FQ Series
Measuring a vehicle’s fuel flow requires a precise system which can run stationary and transient tests. It must also be able to offer high reproducibility and run cycle measurements under real operational conditions, including WLTP. Our FQ Series of fuel flow measurement systems offers a highly precise method of measuring various fuel types, and covers the full range from small engines (incl. single-cylinder research engines) up to heavy-duty engines with up to 5000 kW.
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Current Transformer Analyzer/Tester
GF1061
Beijing GFUVE Electronics Co.,Ltd.
Portable CT PT analyzer is mainly used for field or lab testing, it can finish the measurements (M) and protection (P) class CT, PT and TYP class CT. Adopt 7 inch touch TFT LCD, self-equipped mini type printer supporting field printing; supporting to use USB flash disk to download data or RS232 port to PC control. This model GF1061 CT PT analyzer is the most complete and easy-to-use testing system for protection and metering CTs according to IEEE C57.13 and IEC60044 & IEC61869 standards.
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EMI Test Receiver
SER
Saluki SER series EMI receivers comply with CISPR 16-1-1 standard, integrated CISPR-AVG, CISPR-RMS, QPK detectors, and electromagnetic interference measurement. According to CISPR, EN, FCC and MIL standards, which is suitable for EMI testing in home appliances, lighting, automotive electronics, medical, and other industries. Combined with ETR PC measurement software and a wealth of test options, accurate automated testing is possible. The whole system is equipped with a spectrum analysis module and a tracking signal generator to meet the testing needs of users in different fields.
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Amplifier-per-channel Multiplexed System
System 472
The NEFF System 472 (S472) DAS is a complete moderate-speed DAS for use in computer-based applications. The S472 is designed primarily for computer automated data acquisition in test facilities, laboratories and industrial plants or wherever a moderate-speed DAS is required.
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Semiconductor Testing
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Data Accquisition
High-performance data acquisition system that is designed to perform well during intense, demanding testing.
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Electromagnetic Resonance High Frequency Fatigue Testing Machine
PLG Series
Jinan Testing Equipment IE Corporation
The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system a...show more -
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PCI Strain Gauge Simulator Card, 2-Channel, 350 Ohm
50-265-012
These cards simulates the operation of a range of strain gauges making them ideal for testing strain gauge meters and a wide variety of industrial control systems. They provide a simple way of replacing in house developed sensors with a low cost simulator having excellent performance that is easy to calibrate and use.
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Cable Discharge Solutions
Cable Discharge Event, or CDE, is an electrostatic discharge event that occurs when a cable is connecting to a piece of equipment with different potential. It occurs because there is a potential differential between the charge on a cable to be connected and the equipment. It doesn't matter if the cable is charged or if the equipment is charged. It's the potential differential that causes the discharge. ESDEMC develops commercial system for CDE reliability test and evaluation.
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Equipment Front End Module Wafer Handler
Sigma EFEM
Integration transforms the bond tester into a fully automated system. We offer various types of EFEM (Equipment Front End Module) wafer handlers, to combine with a Sigma W12 for operator-free bond testing.
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In-Circuit Tester
Sigma MTS300
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market. Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
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Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications softwa...show more -
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Prototype Engineering Test
PET-2/PET-3
Exatron's Prototype Engineering Test (PET) Fixture is a semi-automated solution that bridges the gap between a fully automated handling system and a low cost, lower volume handler.
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RFID Label Inspection System
Eurotech RFID FS
The Eurotech RFID FS RFID accurately rewinds rolls of RFID labels and validates their receptivity by running them through the Voyantic Tagsurance RFID inspection system. The unit allows stopping at a predetermined editing spot for the removal and replacement of the defective piece, as well as indicating defective labels by a mark printed by an inkjet system integrated with the machine. Adjustment of the closed loop tension control system can be made through adjusting the parameters on the softwa...show more -
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SFP Based Fiber Optic Test Solution
Eye-BERT Micro
The Eye-BERT Micro is a low cost, easy to use, all-in-one SFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, and optical power and temperature monitoring (per SFP capability). Additionally, with a click of a button, the Eye-BERT Micro will automatically test an SFP module based on the informa...show more -
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Battery and Capacitor Testers
Battery test system developed on the basis of the experience and know-how that we have amassed through implementing numerous custom-built battery evaluation systems.
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Configurable Microwave and Optical Witching Platform
1257
The Astronics 1257 switching system is a high-performance switching and control system available in 4U, 5U, or 6U rack-mountable packages. The unit draws upon our four decades of experience as a major automated test equipment (ATE) switching supplier to set a new standard in switching systems.
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Single Bus 64-Channel 2A PCI Fault Insertion Switch
50-190-101
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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OTDR
Wuhan Sunma Technology Co., Ltd.
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Test Operator Platform
TOP
TOP/TRM provide a multi user test run management for your system test bench: Comfortably create tests, run test batches and review results. The execution queue schedules all tests and also allows prioritized single user access.
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PXI MultiComputing Remote Control Module
PXI MultiComputing Remote Control Modules enable PXI systems to transfer data at multigigabytes per second with only a few microseconds of latency. You can use these models in applications such as real-time tests, hardware-in-the-loop (HIL) tests, and structural tests that need a large number of distributed PXI systems to share data with low latency.
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Software
S!MPATI®
You reach all important functions quickly and easily via the clearly structured S!MPATI® menu with intuitive operation. In addition, a floor plan of your laboratory can be uploaded and the layout of all testing systems visualised for optimal handling. This means, you can control and program all test cabinets conveniently from one computer as well as evaluating their data. This effectively increases the efficiency of your systems and also provides protection against downtime.
